★ 3030 Compact is the new bed-of-nails tester designed to deliver a cost-effective test solution in a very small footprint.
★ Modular and configurable with a complete range of instrumentation and receivers, 3030 C provides 4x throughput and saves more than 75% of overall test cost compared with standard test solutions, thanks to its 4-Core Real Parallel Test Core.
★ 3030 C delivers multiple test capabilities, guaranteeing 100% coverage in a unique integrated high productivity cost-effective system.
? True Parallel Test
? Multi-device Parallel On-Board Programming
? 75% test cost saving
? Precise contacting with SPEA’s receivers
? PC-independent Architecture
? Forget field return
? Hi-speed parametric ICT